Quick Shot

Shown with the diagnostic instrument manipulator (DIM) high-resolution spectrometer (dHiRES) are Senior Manufacturing Engineer, Tom Lewis, and Research Engineer, David Nelson. Designed and built at LLE, the dHIRES will be used at the National Ignition Facility (NIF). The dHIRES is a high-resolution crystal x-ray spectrometer snout for the DIM-based streak camera (DISC). It uses two conical crystals and one cylindrical crystal to measure both time-resolved and time-integrated Kr He_α and He_β lines at stagnation to diagnose plasma conditions. The electron temperature, T_e, and density, n_e, will be measured by doping a surrogate capsule (“SymCap”) with a small amount of krypton gas. The Princeton Plasma Physics Laboratory was responsible for crystal design and will carry out the crystal testing, alignment, and instrument calibration.