Quick Shot

As part of the Certificate in Nanoengineering Program, OPT 254 is a required undergraduate laboratory and is offered through the University’s Institute of Optics in three modules: scanning electron microscopy, atomic force microscopy (AFM), and confocal microscopy. LLE Scientist, Semyon Papernov, shown here with four of his eight students, teaches the AFM module in two sections. In addition to lectures on the nature of forces working at the nanoscale and on principles of atomic force microscopy, students receive hands-on experience in using AFM. Also, discussions on various types of AFM image processing resulting in rich topographical sample information take place. Here, Dr. Papernov discusses the geometry of craters generated in coatings by laser radiation. The Digital Instruments Nanoscope III atomic force microscope, visible at the lower left, was used to take the images that they are discussing.