Quick Shot
Measuring Optics at 355 nm
January 28, 2013
Laboratory engineer Brittany Taylor is shown with a liquid crystal circular polarizer (LCP), an optic used in the IR portion of the OMEGA Laser System. This optic is being loaded onto the measuring area of the Exicor 450XT Mueller Matrix polarimeter. This instrument measures linear retardance, diattenuation, and rotation of optics in the ultraviolet region, specifically at 355 nm. We have observed significant amounts of optical rotation in the UV for LCP’s, for which there are a variety of possible applications.