February 2012 DOE Report
Measurement of Fast-Electron Preheat
An important parameter to be determined in ignition studies is the fast-electron's preheat (mostly due to the two-plasmon-decay instability). This preheat, detrimental to the target performance, can be determined from the measured hard x-ray emission (HXR).
Shown here is the intensity of the Kα line emitted by the inner Mo layer as function of the Mo-layer diameter, normalized to that of the 200-µm case.